Statistical error tolerances of partial discharge recognition rates.
(2015)
Conference Proceeding
MAS'UD, A.A., ELTAYEB, M., MUHAMMAD-SUKKI, F. and BANI, N.A. 2015. Statistical error tolerances of partial discharge recognition rates. In Proceedings of the Institute of Electrical and Electonic Engineers (IEEE) conference on sustainable utilization and development in engineering and technology (CSUDET 2015), 15-17 October 2015, Selangor, Malaysia. Piscataway: IEEE [online], article ID 7446217. Available from: https://dx.doi.org/10.1109/CSUDET.2015.7446217
This paper compares the statistical error tolerances of the single neural network (SNN) and the ensemble neural network (ENN) recognition efficiencies, when both the SNN and ENN are applied to recognize partial discharge (PD) patterns. Statistical fi... Read More about Statistical error tolerances of partial discharge recognition rates..