Evaluating a pass/fail grading model in first year undergraduate computing.
(2023)
Presentation / Conference Contribution
ZARB, M., MCDERMOTT, R., MARTIN, K., YOUNG, T. and MCGOWAN, J. 2023. Evaluating a pass/fail grading model in first year undergraduate computing. In Proceedings of the 2023 IEEE (Institute of Electrical and Electronics Engineers) Frontiers in education conference (FIE 2023), 18-21 October 2023, College Station, TX, USA. Piscataway: IEEE [online], article 10343276. Available from: https://doi.org/10.1109/FIE58773.2023.10343276
This Innovative Practice Full Paper investigates the implications of implementing a Pass/Fail marking scheme within the undergraduate curriculum, specifically across first year computing modules in a Scottish Higher Education Institution. The motivat... Read More about Evaluating a pass/fail grading model in first year undergraduate computing..