Effect of silver incorporation on the structural and morphological characteristics of RF sputtered indium oxide films.

Silpa Satheesh, B.; Kavitha, V. S.; Krishnan, Reshmi; Chalana, S. R.; Suresh, S.; Prabhu, Radhakrishna; Mahadevanpillai, V. P.

doi:10.1088/1757-899x/499/1/012001

Effect of silver incorporation on the structural and morphological characteristics of RF sputtered indium oxide films.

Silpa Satheesh, B.; Kavitha, V. S.; Krishnan, Reshmi; Chalana, S. R.; Suresh, S.; Prabhu, Radhakrishna; Mahadevanpillai, V. P.

Authors

B. Silpa Satheesh

V. S. Kavitha

Reshmi Krishnan

S. R. Chalana

S. Suresh

Professor Radhakrishna Prabhu r.prabhu@rgu.ac.uk
Professor

V. P. Mahadevanpillai

Abstract

Radio frequency (RF) magnetron sputtered silver incorporated indium oxide thin films were prepared and their structural and morphological properties were studied using micro- Raman spectroscopy, Atomic Force Microscopy (AFM), Field Emission Scanning Electron Microscopy (FESEM) and Energy Dispersive Spectroscopy (EDS). Raman modes corresponding to the cubic bixbyite phase of indium oxide were obtained through micro-Raman spectroscopy. AFM images exhibited dense distribution of grains. Elemental analysis using EDS spectra confirmed the presence of indium, silver and oxygen in the prepared films.

Citation

SILPA SATHEESH, B., KAVITHA, V.S., KRISHNAN, R., CHALANA, S.R., SURESH, S., PRABHU, R. and MAHADEVAN PILLAI, V.P. 2019. Effect of silver incorporation on the structural and morphological characteristics of RF sputtered indium oxide films. IOP conference series: materials science and engineering [online], 499: proceedings of the 4th International conference on structural nano composites (NANOSTRUC 2018), 23-24 May 2018, Berlin, Germany, article number 012001. Available from: https://doi.org/10.1088/1757-899x/499/1/012001

Presentation Conference Type	Conference Paper (published)
Conference Name	4th International conference on structural nanocomposites (NANOSTRUC 2018)
Acceptance Date	Feb 6, 2018
Online Publication Date	Apr 3, 2019
Publication Date	Apr 3, 2019
Deposit Date	May 9, 2019
Publicly Available Date	May 10, 2019
Journal	IOP Conference Series: Materials Science and Engineering
Print ISSN	1757-8981
Electronic ISSN	1757-899X
Publisher	IOP Publishing
Peer Reviewed	Peer Reviewed
Volume	499
Article Number	012001
DOI	https://doi.org/10.1088/1757-899x/499/1/012001
Keywords	Radio frequency; Silver; Indium oxide; Thin films; Micro-Raman spectroscopy
Public URL	https://rgu-repository.worktribe.com/output/242049
Contract Date	May 10, 2019