Skip to main content

Research Repository

Advanced Search

Influence of Pr doping on the structural, morphological, optical, luminescent and non-linear optical properties of RF-sputtered ZnO films.

Sreedharan, R. Sreeja; Vinodkumar, R.; Navas, I.; Prabhu, Radhakrishna; Pillai, V.P. Mahadevan

Authors

R. Sreeja Sreedharan

R. Vinodkumar

I. Navas

V.P. Mahadevan Pillai



Abstract

The effects of Pr doping on the structural, morphological, optical and non-linear optical properties have been investigated. X-ray diffraction and Raman analysis reveals the formation of highly c-axis-oriented films with hexagonal wurtzite structure of ZnO. Atomic force microscopy and scanning electron microscopy images reveal the formation of grains with well-defined grain boundaries. The Pr-doped films present excellent optical transparency in the visible region. The photoluminescence spectra show both UV and visible emissions and the intensity of the visible emission increases with Pr doping. Nonlinear optical properties of the Pr-incorporated ZnO nanostructures have been investigated using the open aperture Z-scan technique. It is interesting to note that 1 wt.% praseodymium-incorporated ZnO film shows saturable absorption, whereas the 5 wt.% praseodymium-incorporated ZnO shows reverse saturable absorption and the high value of non-linear absorption coefficient ({esc}gb{esc}s) for 5 wt.% Pr-doped ZnO film suggests the suitability of these films for optoelectronic device applications.

Journal Article Type Article
Publication Date Jan 1, 2016
Journal JOM: Journal of the Minerals, Metals and Materials Society
Print ISSN 1047-4838
Electronic ISSN 1543-1851
Publisher Springer (part of Springer Nature)
Peer Reviewed Peer Reviewed
Volume 68
Issue 1
Pages 341–350
Institution Citation SREEDHARAN, R.S., VINODKUMAR, R., NAVAS, I., PRABHU, R. and PILLAI, V.P.M. 2015. Influence of Pr doping on the structural, morphological, optical, luminescent and non-linear optical properties of RF-sputtered ZnO films. JOM: journal of the Minerals, Metals and Materials Society [online], 68(1), pages 341-350. Available from: https://doi.org/10.1007/s11837-015-1632-0
DOI https://doi.org/10.1007/s11837-015-1632-0
Keywords Pr doped ZnO films; Rf magnetron sputtering; Microraman spectra; Defect emission; Zscan technique

Files





You might also like



Downloadable Citations

;