Influence of Pr doping on the structural, morphological, optical, luminescent and non-linear optical properties of RF-sputtered ZnO films.

Sreeja Sreedharan, R.; Vinodkumar, R.; Navas, I.; Prabhu, Radhakrishna; Pillai, V.P. Mahadevan

Abstract

The effects of Pr doping on the structural, morphological, optical and non-linear optical properties have been investigated. X-ray diffraction and Raman analysis reveals the formation of highly c-axis-oriented films with hexagonal wurtzite structure of ZnO. Atomic force microscopy and scanning electron microscopy images reveal the formation of grains with well-defined grain boundaries. The Pr-doped films present excellent optical transparency in the visible region. The photoluminescence spectra show both UV and visible emissions and the intensity of the visible emission increases with Pr doping. Nonlinear optical properties of the Pr-incorporated ZnO nanostructures have been investigated using the open aperture Z-scan technique. It is interesting to note that 1wt.% praseodymium-incorporated ZnO film shows saturable absorption, whereas the 5wt.% praseodymium-incorporated ZnO shows reverse saturable absorption and the high value of non-linear absorption coefficient (β) for 5wt.% Pr-doped ZnO film suggests the suitability of these films for optoelectronic device applications.

Citation

SREEJA SREEDHARAN, R., VINODKUMAR, R., NAVAS, I., PRABHU, R. and PILLAI, V.P.M. 2015. Influence of Pr doping on the structural, morphological, optical, luminescent and non-linear optical properties of RF-sputtered ZnO films. JOM: journal of the Minerals, Metals and Materials Society [online], 68(1), pages 341-350. Available from: https://doi.org/10.1007/s11837-015-1632-0

• Journal Article Type: Article
• Acceptance Date: Aug 28, 2015
• Online Publication Date: Sep 23, 2015
• Publication Date: Jan 31, 2016
• Deposit Date: Sep 16, 2016
• Publicly Available Date: Sep 24, 2016
• Journal: JOM: Journal of the Minerals, Metals and Materials Society
• Print ISSN: 1047-4838
• Electronic ISSN: 1543-1851
• Publisher: Springer
• Peer Reviewed: Peer Reviewed
• Volume: 68
• Issue: 1
• Pages: 341-350
• DOI: https://doi.org/10.1007/s11837-015-1632-0
• Keywords: Pr doped ZnO films; Rf magnetron sputtering; Microraman spectra; Defect emission; Zscan technique
• Public URL: http://hdl.handle.net/10059/1723