Skip to main content

Research Repository

Advanced Search

Graph edit distance or graph edit pseudo-distance?

Serratosa, Francesc; Cort�s, Xavier; Moreno, Carlos-Francisco

Authors

Francesc Serratosa

Xavier Cort�s



Contributors

Antonio Robles-Kelly
Editor

Marco Loog
Editor

Battista Biggio
Editor

Francisco Escolano
Editor

Richard Wilson
Editor

Abstract

Graph Edit Distance has been intensively used since its appearance in 1983. This distance is very appropriate if we want to compare a pair of attributed graphs from any domain and obtain not only a distance, but also the best correspondence between nodes of the involved graphs. In this paper, we want to analyse if the Graph Edit Distance can be really considered a distance or a pseudo-distance, since some restrictions of the distance function are not fulfilled. Distinguishing between both cases is important because the use of a distance is a restriction in some methods to return exact instead of approximate results. This occurs, for instance, in some graph retrieval techniques. Experimental validation shows that in most of the cases, it is not appropriate to denominate the Graph Edit Distance as a distance, but a pseudo-distance instead, since the triangle inequality is not fulfilled. Therefore, in these cases, the graph retrieval techniques not always return the optimal graph.

Citation

SERRATOSA, F., CORTÉS, X., and MORENO, C.-F. 2016. Graph edit distance or graph edit pseudo-distance? In Robles-Kelly, A., Loog, M., Biggio, B., Escolano, F. and Wilson, R. (eds.). Structural, syntactic, and statistical pattern recognition: proceedings of the 2016 Joint International Association of Pattern Recognition (IAPR) International workshops on Statistical techniques in pattern recognition (SPR) and Structural and syntactic pattern recognition (SSPR) (S+SSPR 2020), 29 November - 2 December 2016, Merida, Mexico. Lecture notes in computer science, 10029. Cham: Springer [online], pages 530-540. Available from: https://doi.org/10.1007/978-3-319-49055-7_47

Conference Name 2016 Joint International Association of Pattern Recognition (IAPR) International workshops on Statistical techniques in pattern recognition (SPR) and Structural and syntactic pattern recognition (SSPR) (S+SSPR 2020)
Conference Location Merida, Mexico
Start Date Nov 29, 2016
End Date Dec 2, 2016
Acceptance Date Jun 1, 2016
Online Publication Date Nov 5, 2016
Publication Date Dec 31, 2016
Deposit Date Jun 5, 2020
Publicly Available Date Jun 30, 2020
Publisher Springer
Pages 530-540
Series Title Lecture notes in computer science
Series Number 10029
Series ISSN 0302-9743
Book Title Structural, syntactic, and statistical pattern recognition: proceedings of the 2016 Joint International Association of Pattern Recognition (IAPR) International workshops on Statistical techniques in pattern recognition (SPR) and Structural and syntactic p
ISBN 9783319490540
DOI https://doi.org/10.1007/978-3-319-49055-7_47
Keywords Graph edit distance; Edit cost; Distance function
Public URL https://rgu-repository.worktribe.com/output/924228

Files




You might also like



Downloadable Citations