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A graph repository for learning error-tolerant graph matching.

Moreno-Garc�a, Carlos Francisco; Cort�s, Xavier; Serratosa, Francesc

Authors

Xavier Cort�s

Francesc Serratosa



Contributors

Antonio Robles-Kelly
Editor

Marco Loog
Editor

Battista Biggio
Editor

Francisco Escolano
Editor

Richard Wilson
Editor

Abstract

In the last years, efforts in the pattern recognition field have been especially focused on developing systems that use graph based representations. To that aim, some graph repositories have been presented to test graph-matching algorithms or to learn some parameters needed on such algorithms. The aim of these tests has always been to increase the recognition ratio in a classification framework. Nevertheless, some graph-matching applications are not solely intended for classification purposes, but to detect similarities between the local parts of the objects that they represent. Thus, current state of the art repositories provide insufficient information. We present a graph repository structure such that each register is not only composed of a graph and its class, but also of a pair of graphs and a ground-truth correspondence between them, as well as their class. This repository structure is useful to analyse and develop graph-matching algorithms and to learn their parameters in a broadly manner. We present seven different databases, which are publicly available, with these structure and present some quality measures experimented on them.

Citation

MORENO-GARCÍA, C.F., CORTÉS, X. and SERRATOSA, F. 2016. A graph repository for learning error-tolerant graph matching. In Robles-Kelly, A., Loog, M., Biggio, B., Escolano, F. and Wilson, R. (eds.) Structural, syntactic and statistical pattern recognition: proceedings of 2016 Joint International Association of Pattern Recognition (IAPR) Structural and syntactic pattern recognition internaional workshops (SSPR 2016), and Statistical techniques in pattern recognition (SPR 2016) (S+SSPR 2016), 20 November - 2 December 2016, Mérida, Mexico. Lecture notes in computer science, 10029. Cham: Springer [online], pages 519-529. Available from: https://doi.org/10.1007/978-3-319-49055-7_46

Conference Name 2016 Joint International Association of Pattern Recognition (IAPR) Structural and syntactic pattern recognition internaional workshops (SSPR 2016), and Statistical techniques in pattern recognition (SPR 2016) (S+SSPR 2016)
Conference Location Mérida, Mexico
Start Date Nov 30, 2016
End Date Dec 2, 2016
Acceptance Date Sep 5, 2016
Online Publication Date Nov 5, 2016
Publication Date Dec 31, 2016
Deposit Date Oct 14, 2020
Publicly Available Date Jan 11, 2021
Publisher Springer
Volume 10029
Pages 519-529
Series Title Lecture notes in computer science
Series ISSN 0302-9743
Book Title Structural, syntactic and statistical pattern recognition: proceedings of 2016 Joint International Association of Pattern Recognition (IAPR) Structural and syntactic pattern recognition internaional workshops (SSPR 2016), and Statistical techniques in pat
ISBN 9783319490540
DOI https://doi.org/10.1007/978-3-319-49055-7_46
Keywords Graph database; Graph-matching algorithm; Graph-learning algorithm
Public URL https://rgu-repository.worktribe.com/output/976248

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