The construction of an ellipsometer to measure the refractive index and thickness of thin films.
(1975)
Thesis
DICK, D.A. 1975. The construction of an ellipsometer to measure the refractive index and thickness of thin films. Robert Gordon's Institute of Technology, MPhil thesis. Hosted on OpenAIR [online]. Available from: https://doi.org/10.48526/rgu-wt-1993264
The ellipsometer, like all precision optical instruments, is a delicate piece of equipment requiring care in its construction, maintenance and operation. Since multiple reflections and birefringence in the optical components introduce large instrumen... Read More about The construction of an ellipsometer to measure the refractive index and thickness of thin films..